Growth and characterization of V2O5 thin film on conductive electrode. (29th September 2016)

• Record Type: Journal Article
• Authors: MOLA, GENENE T.; ARBAB, ELHADI A. A.; TALEATU, BIDINI A.; KAVIYARASU, K.; AHMAD, ISHAQ; MAAZA, M.
• Is Part Of: Journal of microscopy. Volume 265:Part 2(2017)
• Page Start: 214
• Page End: 221
• Publication Date: 2016-09-29
• Subjects: Electrochemical deposition -- optical band gap -- PL -- V2O5 thin films; Microscopy -- Periodicals; 502.82
• DOI: 10.1111/jmi.12490
• Languages: English
• ISSNs: 0022-2720

Abstract

Summary: Vanadium pentoxide V2 O5 thin films were grown at room temperature on ITO coated glass substrates by electrochemical deposition. The resulting films were annealed at 300, 400 and 500°C for 1 h in ambient environment. The effect of heat treatment on the films properties such as surface morphology, crystal structure, optical absorption and photoluminescence were investigated. The x‐ray diffraction study showed that the films are well crystallized with temperatures. Strong reflection from plane (400) indicated the film's preferred growth orientation. The V2 O5 films are found to be highly transparent across the visible spectrum and the measured photoluminescence quenching suggested the film's potential application in OPV device fabrication.