Cite
HARVARD Citation
Angerer, P. et al. (2016). Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures. Powder diffraction. 31 (4), pp. 267-273. [Online].
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Angerer, P. et al. (2016). Curvature determination of embedded silicon chips by in situ rocking curve X-ray diffraction measurements at elevated temperatures. Powder diffraction. 31 (4), pp. 267-273. [Online].