Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines – ERRATUM. (15th December 2016)

Record Type:: Journal Article
Title:: Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines – ERRATUM. (15th December 2016)
Main Title:: Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines – ERRATUM
Authors:: Llovet, Xavier
Pinard, Philippe T.
Heikinheimo, Erkki
Louhenkilpi, Seppo
Richter, Silvia
Abstract:
Is Part Of:: Microscopy and microanalysis. Volume 22:Number 6(2016:Dec.)
Journal:: Microscopy and microanalysis
Issue:: Volume 22:Number 6(2016:Dec.)
Issue Display:: Volume 22, Issue 6 (2016)
Year:: 2016
Volume:: 22
Issue:: 6
Issue Sort Value:: 2016-0022-0006-0000
Page Start:: 1389
Page End:: 1389
Publication Date:: 2016-12-15
Subjects:: Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:: https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:: 10.1017/S1431927616012575 ↗
Languages:: English
ISSNs:: 1431-9276
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 1725.xml