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HARVARD Citation
Du, X. et al. (n.d.). X-ray reflectometry investigation of interfacial structure of CrAlN/TiAlN multilayers. MRS communications. pp. 408-415. [Online].
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Du, X. et al. (n.d.). X-ray reflectometry investigation of interfacial structure of CrAlN/TiAlN multilayers. MRS communications. pp. 408-415. [Online].