Data Analysis Environment for X-ray Free-Electron Laser Experiments at SACLA. Issue 1 (2nd January 2017)

• Record Type: Journal Article
• Authors: Joti, Yasumasa; Nakajima, Kyo; Kameshima, Takashi; Yamaga, Mitsuhiro; Abe, Toshinori; Okada, Kensuke; Sugimoto, Takashi; Hatsui, Takaki; Yabashi, Makina
• Is Part Of: Synchrotron radiation news. Volume 30:Issue 1(2017)
• Page Start: 16
• Page End: 21
• Publication Date: 2017-01-02
• Subjects: Synchrotron radiation -- Periodicals; Synchrotron radiation sources -- Periodicals; 539.735
• DOI: 10.1080/08940886.2017.1267556
• Languages: English
• ISSNs: 0894-0886

Abstract

Abstract : X-ray free-electron lasers (XFELs) with full spatial coherence, extreme brilliance, and ultra-fast pulse duration [1, 2 ] allow the investigation of complex phenomena in physics, chemistry, and biology with angstrom and femtosecond resolutions. In particular, a concept of "diffraction before destruction" [3 ] has been demonstrated for serial femtosecond crystallography (SFX) [4, 5 ] and coherent diffractive imaging (CDI) [6 ]. Using femto-second XFEL pulses, diffraction data are collected before radiation damage to samples has time to occur. Since samples are exchanged for each XFEL pulse, shot-to-shot data acquisition (DAQ) is mandatory to correlate the recorded data with the sample characteristics. The shot-to-shot DAQ must be synchronized with the repetition rate of the XFEL source, typically several tens to one hundred Hz for the machine based on normal-conducting accelerators. Shot-to-shot recording of XFEL pulse characteristics is also essential because they fluctuate due to the stochastic nature of a self-amplified spontaneous emission (SASE). We must carefully analyze a huge data set taking the fluctuation into account.