Perovskite Films: Mapping Morphological and Structural Properties of Lead Halide Perovskites by Scanning Nanofocus XRD (Adv. Funct. Mater. 45/2016). (December 2016)

• Record Type: Journal Article
• Authors: Lilliu, Samuele; Dane, Thomas G.; Alsari, Mejd; Griffin, Jonathan; Barrows, Alexander T.; Dahlem, Marcus S.; Friend, Richard H.; Lidzey, David G.; Macdonald, J. E.
• Is Part Of: Advanced functional materials. Volume 26:Number 45(2016)
• Page Start: 8220
• Page End: 8220
• Publication Date: 2016-12
• Subjects: mixed lead halide perovskites -- scanning nanofocus X‐ray diffraction -- solar cells, scanning electron microscopy, grazing‐incidence wide‐angle X‐ray scattering; Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adfm.201670297
• Languages: English
• ISSNs: 1616-301X

Abstract

Abstract : On page 8221, S. Lilliu and co‐workers show how synchrotron nXRD can be used to simultaneously probe the morphology and the structural properties of spin‐coated CH3 NH3 PbI3 perovskite films for photovoltaic devices. A method to visualize, selectively isolate, and structurally characterize single perovskite grains buried within a complex, polycrystalline film is developed.