High mass and spatial resolution mass spectrometry imaging of Nicolas Poussin painting cross section by cluster TOF‐SIMS. (3rd November 2016)

• Record Type: Journal Article
• Authors: Noun, Manale; Van Elslande, Elsa; Touboul, David; Glanville, Helen; Bucklow, Spike; Walter, Philippe; Brunelle, Alain
• Is Part Of: Journal of mass spectrometry. Volume 51:Number 12(2016)
• Page Start: 1196
• Page End: 1210
• Publication Date: 2016-11-03
• Subjects: TOF‐SIMS imaging -- pigments -- organic matters (oils and proteins) -- cultural heritage -- Nicolas Poussin; Mass spectrometry -- Periodicals; 543.65
• DOI: 10.1002/jms.3885
• Languages: English
• ISSNs: 1076-5174

Abstract

Abstract : Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) imaging using cluster primary ion beams is used for the identification of the pigments in the painting of Rebecca and Eliezer at the Well by Nicolas Poussin. The combination of the high mass resolution of the technique with a sub‐micrometer spatial resolution offered by a delayed extraction of the secondary ions, together with the possibility to simultaneously identifying both minerals and organics, has proved to be the method of choice for the study of the stratigraphy of a paint cross section. The chemical compositions of small grains are shown with the help of a thorough processing of the data, with images of specific ions, mass spectra extracted from small regions of interest, and profiles drawn along the different painting layers. Copyright © 2016 John Wiley & Sons, Ltd.