Cite
HARVARD Citation
Halak, B. et al. (2016). The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. Microelectronics and reliability. pp. 74-81. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Halak, B. et al. (2016). The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. Microelectronics and reliability. pp. 74-81. [Online].