Cite
HARVARD Citation
Gomez, A. et al. (2016). Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectronics and reliability. pp. 150-158. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Gomez, A. et al. (2016). Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectronics and reliability. pp. 150-158. [Online].