Optical and EPR studies of Cu2+ doped SnO2 thin films by spray pyrolysis. (23rd February 2017)

• Record Type: Journal Article
• Authors: Rao, M. C.; Ravindranadh, K.
• Is Part Of: Materials research innovations. Volume 21:Number 2(2017)
• Page Start: 102
• Page End: 105
• Publication Date: 2017-02-23
• Subjects: SnO2 -- Copper ions -- Spray pyrolysis -- Powder X-ray diffraction -- Optical and EPR techniques; Materials -- Research -- Periodicals; Matériaux -- Recherche -- Périodiques; 620.1105
• DOI: 10.1080/14328917.2016.1192712
• Languages: English
• ISSNs: 1432-8917

Abstract

Abstract : The study and application of thin film technology is entirely entered in to almost all the branches of science and technology. Semiconductor oxide thin films are materials with numerous applications in electronic and optoelectronic devices as well as some other applications such as protective coatings, heat mirrors and catalysis. In the context of world energy demand, particularly energy conversion, transparent conductive oxides based semiconductor oxides plays a crucial role in the development of new-fashioned thin film solar cells. Present study describing the synthesis and study of optical and structural characteristics of copper ions doped tin oxide (SnO2 ) is really more interesting for researchers due to its vast applications. Cu 2+ -doped tin oxide thin films were prepared by chemical spray pyrolysis synthesis and characterised by powder XRD, optical and EPR studies. Powder XRD data revealed that the crystal structure belongs to tetragonal rutile phase and its lattice cell parameters, average crystallite size were evaluated. Optical and EPR data confirmed that the doped Cu 2+ enter into host material as distorted octahedral symmetry.