Environmental Instability and Degradation of Single‐ and Few‐Layer WTe2 Nanosheets in Ambient Conditions. Issue 42 (8th September 2016)

• Record Type: Journal Article
• Authors: Ye, Fan; Lee, Jaesung; Hu, Jin; Mao, Zhiqiang; Wei, Jiang; Feng, Philip X.‐L.
• Is Part Of: Small. Volume 12:Issue 42(2016)
• Page Start: 5802
• Page End: 5808
• Publication Date: 2016-09-08
• Subjects: 2D semiconductors -- AES -- degradation -- Raman -- tungsten ditelluride (WTe2) -- nanosheets; Nanotechnology -- Periodicals; Nanoparticles -- Periodicals; Microtechnology -- Periodicals; 620.5
• DOI: 10.1002/smll.201601207
• Languages: English
• ISSNs: 1613-6810

Abstract

Abstract : The ambient environmental instability and degradation mechanism of single‐ and few‐layer WTe2 are investigated. Oxidation of W and Te atoms appears to be a main reason for degradation. Single‐layer samples' Raman signals disappear within 20 min in air. Few‐layer WTe2 exhibits saturating degradation behavior: only the top layer WTe2 is oxidized; the degraded layer can protect inner layers from further degradation.