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HARVARD Citation
Leiva, V. et al. (2017). A methodology based on the Birnbaum–Saunders distribution for reliability analysis applied to nano-materials. Reliability engineering & system safety. pp. 192-201. [Online].
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Leiva, V. et al. (2017). A methodology based on the Birnbaum–Saunders distribution for reliability analysis applied to nano-materials. Reliability engineering & system safety. pp. 192-201. [Online].