Cite
HARVARD Citation
Carl, M. et al. (2014). Dual-Beam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB): A Practical Method for Characterization of Small Cultural Heritage Objects. MRS proceedings. p. . [Online].
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Carl, M. et al. (2014). Dual-Beam Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB): A Practical Method for Characterization of Small Cultural Heritage Objects. MRS proceedings. p. . [Online].