Abundance of field‐ionized ion species and current stability of ion beam emitted in He–Ne gas mixture. (27th July 2016)

• Record Type: Journal Article
• Authors: Komaki, Keisuke; Nagai, Shigekazu; Iwata, Tatsuo; Kajiwara, Kazuo; Hata, Koichi
• Other Names: Suzuki Motofumi guestEditor.
• Is Part Of: Surface and interface analysis. Volume 48:Number 11(2016)
• Page Start: 1139
• Page End: 1143
• Publication Date: 2016-07-27
• Subjects: gas field ion source -- field ionization -- time‐of‐flight mass spectrometry -- field adsorption; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.6091
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : An attempt to increase the He ion current of a gas field ion source is made using a He–Ne mixture. The abundance of each ion in the produced ion beam is examined as a function of the applied field, along with the composition of the supplied gas mixture, using a field ion microscope equipped with a time‐of‐flight mass spectrometer. The operating conditions under which the He ion current is enhanced and no Ne ions are detected are confirmed. For the conditions under which He and Ne ions are detected simultaneously, a spike‐like current change showing the positive correlation between each ion current is observed. Copyright © 2016 John Wiley & Sons, Ltd.