Combined X-ray absorption and X-ray diffraction under high pressure. Issue 3 (2nd July 2016)

• Record Type: Journal Article
• Authors: Itié, Jean-Paul; Polian, Alain; Baudelet, François; Mocuta, Cristian; Thiaudière, Dominique; Fonda, Emiliano; Irifune, Tetsuo
• Is Part Of: High pressure research. Volume 36:Issue 3(2016)
• Page Start: 479
• Page End: 492
• Publication Date: 2016-07-02
• Subjects: X-ray absorption spectroscopy -- X-ray diffraction -- nanopolycrystalline diamond anvils; High pressure (Science) -- Periodicals; High pressure (Technology) -- Periodicals; 536.41
• DOI: 10.1080/08957959.2016.1206540
• Languages: English
• ISSNs: 0895-7959

Abstract

ABSTRACT: X-ray absorption spectroscopy (XAS) and X-ray diffraction (XRD) are two complementary structural techniques. Their combination improves the understanding of the effect of pressure on materials as illustrated by examples taken from studies on different types of materials (semiconductors, molecular solid, ferroelectric perovskite and gas mixture). The introduction of nanopolycrystalline diamonds anvils has extended XAS to high-energy edges with the possibility to use energy-scanning XAS beamlines where XRD can be performed in addition to XAS experiments.