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HARVARD Citation
Hellgren, N. et al. (2016). Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS. Carbon. pp. 242-252. [Online].
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Hellgren, N. et al. (2016). Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS. Carbon. pp. 242-252. [Online].