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HARVARD Citation
Engwall, A. et al. (2016). Origins of residual stress in thin films: Interaction between microstructure and growth kinetics. Materials & design. pp. 616-623. [Online].
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Engwall, A. et al. (2016). Origins of residual stress in thin films: Interaction between microstructure and growth kinetics. Materials & design. pp. 616-623. [Online].