Cite
HARVARD Citation
Belmonte, A. et al. (2016). Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 μA). Solid-state electronics. pp. 189-197. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Belmonte, A. et al. (2016). Impact of temperature and programming method on the data retention of Cu/Al2O3-based conductive-bridge RAM operated at low-current (10 μA). Solid-state electronics. pp. 189-197. [Online].