Cite
HARVARD Citation
Ndiaye, C. et al. (2016). Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. Microelectronics and reliability. pp. 158-162. [Online].
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Ndiaye, C. et al. (2016). Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. Microelectronics and reliability. pp. 158-162. [Online].