Cite
HARVARD Citation
Bravaix, A. et al. (2016). Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. Microelectronics and reliability. pp. 163-167. [Online].
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Bravaix, A. et al. (2016). Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. Microelectronics and reliability. pp. 163-167. [Online].