Cite
HARVARD Citation
Choi, J. et al. (2016). Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectronics and reliability. pp. 215-219. [Online].
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Choi, J. et al. (2016). Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectronics and reliability. pp. 215-219. [Online].