Cite
HARVARD Citation
Reigosa, P. et al. (2016). Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. Microelectronics and reliability. pp. 524-529. [Online].
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Reigosa, P. et al. (2016). Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. Microelectronics and reliability. pp. 524-529. [Online].