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Sun, Y. et al. (2016). Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT. Microelectronics and reliability. pp. 41-46. [Online].
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Sun, Y. et al. (2016). Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT. Microelectronics and reliability. pp. 41-46. [Online].