In-situ electrochemical atomic force microscopy study of aging of magnetron sputtered Pt-Co nanoalloy thin films during accelerated degradation test. (1st September 2016)

• Record Type: Journal Article
• Authors: Khalakhan, Ivan; Vorokhta, Mykhailo; Václavů, Michal; Šmíd, Břetislav; Lavková, Jaroslava; Matolínová, Iva; Fiala, Roman; Tsud, Nataliya; Skála, Tomáš; Matolín, Vladimír
• Is Part Of: Electrochimica acta. Volume 211(2016)
• Page Start: 52
• Page End: 58
• Publication Date: 2016-09-01
• Subjects: electrochemical AFM -- thin film -- Pt-Co -- cyclic voltammetry -- oxygen reduction reaction; Electrochemistry -- Periodicals; Electrochemistry, Industrial -- Periodicals; 541.37
• DOI: 10.1016/j.electacta.2016.06.035
• Languages: English
• ISSNs: 0013-4686

Abstract

Abstract: A Pt-Co nanoalloy thin film catalyst was prepared by using simultaneous magnetron sputtering of Pt and Co. The catalyst was characterized during accelerated degradation test using in-situ electrochemical atomic force microscopy complemented with ex-situ techniques such as energy dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy and synchrotron radiation photoelectron spectroscopy. The combined results gave the full step-by-step picture of the catalyst behavior during the aging test.