Dynamic parametric design and feasibility assessment for a high resistance measuring system. (October 2016)

• Record Type: Journal Article
• Authors: Huang, Chien-Yi; Ying, Kuo-Ching
• Is Part Of: Measurement. Volume 92(2016)
• Page Start: 42
• Page End: 49
• Publication Date: 2016-10
• Subjects: High resistance measuring system -- SIR -- ECM -- Dynamic parametric design; Weights and measures -- Periodicals; Measurement -- Periodicals; Measurement; Weights and measures; Periodicals; 530.8
• DOI: 10.1016/j.measurement.2016.05.063
• Languages: English
• ISSNs: 0263-2241

Abstract

Highlights: A high resistance measuring system is used to monitor the current leakage. We construct a dynamic parameter design to optimize the test parameters. Test time, test voltage, charge time and pause interval are under consideration. GR&R results confirm that our suggested test parameters exhibit small variability. Abstract: A high resistance measuring system (HRMS) is used to measure the surface insulation resistance (SIR) values of the printed circuit board (PCB), and monitor whether a momentary circuit short and/or the case of current slow leakage occur, which will affect the electrical properties of electronic components. This study constructs a dynamic parameter design for optimization of the test parameters of the HRMS in order to obtain robust test results. The optimal test parameters for SIR testing are: 390 ms test time, 100 V test voltage, 100 V, 15 s charge time, and 100 s pause interval. Further investigation is conducted on the impact of the test parameters on the measurement performance.