Cite
HARVARD Citation
Su, W. et al. (2016). Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy. Chemical communications. 52 (53), pp. 8227-8230. [Online].
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Su, W. et al. (2016). Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy. Chemical communications. 52 (53), pp. 8227-8230. [Online].