The application of infrared thermo-camera in testing of silicon-based thin-film solar cells. Issue 1771 (13th May 2015)

• Record Type: Journal Article
• Authors: Han, Meiying; Zhu, Yonghong; Xie，Xiangqi Luo, Xishun; Tang, Liangneng; Tan, Yiping
• Editors: Gloeckler, M.; Tiwari, A.N.; Yamada, A.; Yan, Y.; Kim, J.Y.; Miyasaka, T.; Mora-Seró, I.; Zhu, K.; Andersson, M.; Manca, J.V.; Palomares, E.; Vandewal, K.; Li, T.; Mastro, M.; Tao, M.; Wang, Q.
• Is Part Of: MRS proceedings. Issue 1771(2015)
• Publication Date: 2015-05-13
• Subjects: thin film, -- thermoelectric, -- defects; Electrical engineering -- Congresses; Physics -- Congresses; Materials -- Research -- Congresses; Materials science -- Congresses; 620.11
• DOI: 10.1557/opl.2015.456
• Languages: English
• ISSNs: 0272-9172

Abstract

ABSTRACT: Thermo-camera is employed here to analyze kinds of quality abnormal and improve production process during manufacture procedure of silicon-based thin-film solar modules. It shows that thermo-camera device can help engineers to solve problem of production line quickly and accurately, and save the manpower and financial resources at the same time.