Dynamic photo-induced force microscopy. Issue 1754 (16th March 2015)

• Record Type: Journal Article
• Authors: Jahng, Junghoon; Potma, Eric O.
• Editors: Barabash, R.; Benning, L.G.; Genc, A.; Kim, Y.; Lereu, A.; Li, D.; Lienert, U.; Liss, K.D.; Ohnuma, M.; Ovchinnikova, O.; Passian, A.; Rimer, J.D.; Tetard, L.; Thundat, T.; Zenobi, R.; Zorba, V.
• Is Part Of: MRS proceedings. Issue 1754:(2015)
• Publication Date: 2015-03-16
• Subjects: laser-induced reaction, -- nanoscale, -- scanning probe microscopy (SPM); Electrical engineering -- Congresses; Physics -- Congresses; Materials -- Research -- Congresses; Materials science -- Congresses; 620.11
• DOI: 10.1557/opl.2015.255
• Languages: English
• ISSNs: 0272-9172

Abstract

ABSTRACT: We provide a general description of the operating principle of the photo-induced force microscope (PiFM), which probes the optically induced changes in the dipolar interactions between a sharp polarizable tip and the sample, in terms of classical fields and forces. We rigorously calculate the photo-induced force behavior and compare the predicted profile with experimental results obtained from a gold nanowire.