Mapping quantitative trait loci associated with grain filling duration and grain number under terminal heat stress in bread wheat (Triticum aestivum L.). (19th August 2016)

• Record Type: Journal Article
• Authors: Sharma, Davinder; Singh, Rajender; Rane, Jagadish; Gupta, Vijay Kumar; Mamrutha, Harohalli Masthigowda; Tiwari, Ratan
• Editors: Bürstmayr, H.
• Is Part Of: Plant breeding. Volume 135:Number 5(2016)
• Page Start: 538
• Page End: 545
• Publication Date: 2016-08-19
• Subjects: terminal heat stress -- grain filling duration -- grain number -- QTL -- wheat; Plant breeding -- Periodicals; 631.52
• DOI: 10.1111/pbr.12405
• Languages: English
• ISSNs: 0179-9541

Abstract

Abstract: Terminal heat stress has the potential negative impact on wheat production across the world, especially in South Asia. Under the threat of terminal heat stress, wheat genotypes with stay green trait would suffer from high temperature stress during their long grain filling duration (GFD). The genotypes with short GFD would be advantageous. To identify quantitative trait loci (QTL) for heat tolerance, a RIL population of K 7903 (heat tolerant) and RAJ 4014 (heat sensitive) wheat genotypes was investigated under timely and late‐sown conditions. Heat susceptibility index of GFD, yield components and traits under late‐sown condition were used as phenotypic data for QTL identification. Stable QTLs associated with these traits were identified on chromosomes 1B, 2B, 3B, 5A and 6B. The LOD value ranged from 2.9 to 5.0 and the corresponding phenotyping variation explained ranged from 12.0–22%. QTL for heat susceptibility index for the grain filling duration were colocalized with QTL for productive tillers under late sown and GFD under late‐sown condition on chromosomes 1B and 5A, respectively. These genomic regions could be exploited for molecular wheat breeding programmes targeting heat tolerance.