Effect of Annealing on Structural Properties of Electrodeposited CZTS Thin Films. Issue 1 (2nd January 2016)

• Record Type: Journal Article
• Authors: Shiyani, Tulshi; Patel, Malkesh; Mukhopadhyay, Indrajeet; Ray, Abhijit
• Is Part Of: IETE technical review. Volume 33:Issue 1(2016)
• Page Start: 2
• Page End: 6
• Publication Date: 2016-01-02
• Subjects: Cyclic voltammetry -- Electrodeposition; Telecommunication -- Periodicals; Electronics -- Periodicals; Electronics; Telecommunication; Periodicals; 621.38
• DOI: 10.1080/02564602.2015.1045044
• Languages: English
• ISSNs: 0256-4602

Abstract

ABSTRACT: Cu2 ZnSnS4 (CZTS) thin films were electrodeposited on Mo substrates at room temperature by a single-step electrodeposition method. The X-ray diffraction showed that, the as-prepared samples were rich in secondary phases. However, the Raman spectra showed the existence of crystalline CZTS phase. The post-annealing treatment was carried out in the temperature range 400 °C–600 °C in an Ar-atmosphere to improve the CZTS phase composition and crystallinity. The kesterite CZTS phase grew to larger extent upon annealing at 500 °C.