Local Solar Cell Efficiency Analysis Performed by Injection-dependent PL Imaging (ELBA) and Voltage-dependent Lock-in Thermography (Local I-V). (August 2016)

• Record Type: Journal Article
• Authors: Breitenstein, Otwin; Frühauf, Felix; Bauer, Jan; Schindler, Florian; Michl, Bernhard
• Is Part Of: Energy procedia. Volume 92(2016)
• Page Start: 10
• Page End: 15
• Publication Date: 2016-08
• Subjects: Local efficiency analysis -- PL imaging -- lock-in thermography -- ELBA -- Local I-V; Power resources -- Congresses; Power resources -- Periodicals; Power resources; Conference proceedings; Periodicals; 333.7905
• DOI: 10.1016/j.egypro.2016.07.003
• Languages: English
• ISSNs: 1876-6102

Abstract

Abstract: In this contribution two methods for performing local efficiency analysis of solar cells are compared with each other by applying them to a solar cell and a neighboring wafer. The first method called "ELBA" is based on injection-dependent photoluminescence (PL) imaging of a passivated wafer. The second method called "Local I-V" is based on voltage-dependent dark lock-in thermography (DLIT) on a solar cell. The results of both methods with respect to the influence of the bulk on the local solar cell parameters are comparable with each other. However, since only "Local I-V" is investigating a finished solar cell, it may image also local ohmic shunts, inhomogeneous front- and backside and depletion region recombination, and R s effects, whereas "ELBA" is suited for assessing bulk-related efficiency losses in detail, which are not concealed by the aforementioned cell-related loss mechanisms in this method.