Cite
HARVARD Citation
Nandi, A. et al. (2016). Oxide thickness and S/D junction depth based variation aware OTA design using underlap FinFET. Microelectronics journal. pp. 19-25. [Online].
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Nandi, A. et al. (2016). Oxide thickness and S/D junction depth based variation aware OTA design using underlap FinFET. Microelectronics journal. pp. 19-25. [Online].