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HARVARD Citation
Liu, Z. et al. (n.d.). Dielectric engineering of Ge nanocrystal/SiO2 nanocomposite thin films with Ge ion implantation: Modeling and measurement. Materials & design. pp. 713-718. [Online].
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Liu, Z. et al. (n.d.). Dielectric engineering of Ge nanocrystal/SiO2 nanocomposite thin films with Ge ion implantation: Modeling and measurement. Materials & design. pp. 713-718. [Online].