Test Reliability at the Individual Level. Issue 4 (3rd July 2016)

• Record Type: Journal Article
• Authors: Hu, Yueqin; Nesselroade, John R.; Erbacher, Monica K.; Boker, Steven M.; Burt, S. Alexandra; Keel, Pamela K.; Neale, Michael C.; Sisk, Cheryl L.; Klump, Kelly
• Is Part Of: Structural equation modeling. Volume 23:Issue 4(2016)
• Page Start: 532
• Page End: 543
• Publication Date: 2016-07-03
• Subjects: individual reliability -- PANAS -- parallel tests -- SEM; Multivariate analysis -- Periodicals; Social sciences -- Statistical methods -- Periodicals; 519.535
• DOI: 10.1080/10705511.2016.1148605
• Languages: English
• ISSNs: 1070-5511

Abstract

Abstract : Reliability has a long history as one of the key psychometric properties of a test. However, a given test might not measure people equally reliably. Test scores from some individuals might have considerably greater error than others. This study proposed two approaches using intraindividual variation to estimate test reliability for each person. A simulation study suggested that the parallel tests approach and the structural equation modeling approach recovered the simulated reliability coefficients. Then in an empirical study, where 45 females were measured daily on the Positive and Negative Affect Schedule (PANAS) for 45 consecutive days, separate estimates of reliability were generated for each person. Results showed that reliability estimates of the PANAS varied substantially from person to person. The methods provided in this article apply to tests measuring changeable attributes and require repeated measures across time on each individual. This article also provides a set of parallel forms of PANAS.