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HARVARD Citation
Yuan, T. et al. (n.d.). A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. Reliability engineering & system safety. pp. 55-63. [Online].
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Yuan, T. et al. (n.d.). A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. Reliability engineering & system safety. pp. 55-63. [Online].