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HARVARD Citation
Ganesan, K. et al. (2016). A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures. Physical chemistry chemical physics. 18 (32), pp. 22160-22167. [Online].
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Ganesan, K. et al. (2016). A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures. Physical chemistry chemical physics. 18 (32), pp. 22160-22167. [Online].