CCP‐FEL: a collection of computer programs for free‐electron laser research. Issue 4 (2nd August 2016)

• Record Type: Journal Article
• Authors: Maia, Filipe R. N. C.; White, Thomas A.; Loh, N. Duane; Hajdu, Janos
• Is Part Of: Journal of applied crystallography. Volume 49:Issue 4(2016)
• Page Start: 1117
• Page End: 1120
• Publication Date: 2016-08-02
• Subjects: free‐electron lasers -- computer programs; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576716011134
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : The latest virtual special issue of Journal of Applied Crystallography (http://journals.iucr.org/special_issues/2016/ccpfel ) presents tools for a range of topics in free‐electron laser research such as simulation of experiments, online monitoring of data collection, selection of hits, diagnostics of data quality, data management, data analysis and structure determination for both nanocrystallography and single‐particle diffractive imaging. Abstract : The latest virtual special issue of Journal of Applied Crystallography (http://journals.iucr.org/special_issues/2016/ccpfel ) collects software for free‐electron laser research and presents tools for a range of topics such as simulation of experiments, online monitoring of data collection, selection of hits, diagnostics of data quality, data management, data analysis and structure determination for both nanocrystallography and single‐particle diffractive imaging. This article provides an introduction to the special issue.