Cite
HARVARD Citation
Baeumer, C. et al. (2016). Verification of redox-processes as switching and retention failure mechanisms in Nb:SrTiO3/metal devices. Nanoscale. 8 (29), pp. 13967-13975. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Baeumer, C. et al. (2016). Verification of redox-processes as switching and retention failure mechanisms in Nb:SrTiO3/metal devices. Nanoscale. 8 (29), pp. 13967-13975. [Online].