Cite
HARVARD Citation
Gao, B. et al. (n.d.). A temperature spectrum density distribution based condition evaluation method and application in IGBT. Applied thermal engineering. pp. 1440-1457. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Gao, B. et al. (n.d.). A temperature spectrum density distribution based condition evaluation method and application in IGBT. Applied thermal engineering. pp. 1440-1457. [Online].