Digital image correlation-based analysis of strain accumulation on a duplex γ-TiAl. (August 2016)

• Record Type: Journal Article
• Authors: Patriarca, L.; Filippini, M.; Beretta, S.
• Is Part Of: Intermetallics. Volume 75(2016:Aug.)
• Page Start: 42
• Page End: 50
• Publication Date: 2016-08
• Subjects: Titanium aluminides -- Based on TiAl -- Digital image correlation -- Strain tensor; Intermetallic compounds -- Metallography -- Periodicals; Metallic glasses -- Periodicals; Composés intermétalliques -- Métallographie -- Périodiques; 669.94
• DOI: 10.1016/j.intermet.2016.05.013
• Languages: English
• ISSNs: 0966-9795

Abstract

Abstract: This paper discusses the experimental results obtained for a duplex γ-TiAl alloy deformed at room temperature. High resolution digital image correlation was used to measure local strain fields. The characterization of the microstructure was performed using optical microscopy and a precise correlation between the strain fields and the microstructure was found. High local strains were measured along well-oriented lamellar grains, in particular for the γ-phase. Furthermore, the analysis of the two-dimensional strain tensor shows that the largest strain component is the shear strain in the plane of the lamellar grains. This study aims to provide further understanding of the deformation behavior of γ-TiAl alloys. Highlights: Duplex γ-TiAl alloy was deformed under static and fatigue loadings. Strains were measured through digital image correlation and correlated with the local microstructure. Well-oriented lamellar grains show the largest strain localizations in terms of shear displacements. The analysis of the strain components elucidates the deformation behavior of duplex γ-TiAl.