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HARVARD Citation
Ortel, E. et al. (2016). In‐depth structural and chemical characterization of engineered TiO2 films. Surface and interface analysis. pp. 664-669. [Online].
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Ortel, E. et al. (2016). In‐depth structural and chemical characterization of engineered TiO2 films. Surface and interface analysis. pp. 664-669. [Online].