Characterization of Metal‐Organic Frameworks Using X‐ray Diffraction. Issue 7 (12th May 2016)

• Record Type: Journal Article
• Authors: Herrmann, Michael; Kempa, Paul Bernd; Fietzek, Harald; Altenburg, Thomas; Polyzoidis, Angelos; Piscopo, Calogero Giancarlo; Löbbecke, Stefan
• Other Names: Teipel Ulrich sponsoringEditor.
• Is Part Of: Chemie Ingenieur Technik. Volume 88:Issue 7(2016:Jul.)
• Page Start: 967
• Page End: 970
• Publication Date: 2016-05-12
• Subjects: Metal‐organic frameworks -- Microstructure -- X‐ray diffraction; Chemical engineering -- Patents -- Periodicals; Chemical engineering -- Periodicals; Chemical industry -- Periodicals; Chemistry, Technical -- Periodicals; 660.05
• DOI: 10.1002/cite.201500123
• Languages: English
• ISSNs: 0009-286X

Abstract

Abstract: Metal‐organic frameworks (MOFs) are nanoporous materials with a very large inner surface. Selected MOFs with a high potential for industrial application are investigated and characterized using X‐ray diffraction. During this process, impurities and defective batches can be detected at an early stage and the manufacturing processes could be refined or corrected accordingly. In addition, important information on the real structures of the products is obtained. It is thus possible to achieve the target structure and to tailor particle properties to the application profile. Abstract : Structural investigations enable to optimize manufacturing processes and to tailor the microstructure to the application profile. Besides the identification of target structures and by‐products, the degree of crystallinity, crystal density, and crystallite size of metal organic frameworks have been monitored.