Atomic resolution electron tomography. (7th July 2016)

• Record Type: Journal Article
• Authors: Bals, Sara; Goris, Bart; De Backer, Annick; Van Aert, Sandra; Van Tendeloo, Gustaaf
• Is Part Of: MRS bulletin. Volume 41:Number 7(2016:Jul.)
• Page Start: 525
• Page End: 530
• Publication Date: 2016-07-07
• Subjects: transmission electron microscopy (TEM), -- nanostructure, -- crystallographic structure, -- defects; Materials -- Periodicals; 620.11
• DOI: 10.1557/mrs.2016.138
• Languages: English
• ISSNs: 0883-7694

Abstract

Abstract: Abstract : Over the last two decades, three-dimensional (3D) imaging by transmission electron microscopy or "electron tomography" has evolved into a powerful tool to investigate a variety of nanomaterials in different fields, such as life sciences, chemistry, solid-state physics, and materials science. Most of these results were obtained with nanometer-scale resolution, but different approaches have recently pushed the resolution to the atomic level. Such information is a prerequisite to understand the specific relationship between the atomic structure and the physicochemical properties of (nano)materials. We provide an overview of the latest progress in the field of atomic-resolution electron tomography. Different imaging and reconstruction approaches are presented, and state-of-the-art results are discussed. This article demonstrates the power and importance of electron tomography with atomic-scale resolution.