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Chen, J. et al. (n.d.). High‐fidelity AFM scanning stage based on multilayer ceramic capacitors. Scanning. 38 (3), pp. 184-190. [Online].
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Chen, J. et al. (n.d.). High‐fidelity AFM scanning stage based on multilayer ceramic capacitors. Scanning. 38 (3), pp. 184-190. [Online].