Energy‐Filtered Backscattered Imaging Using Low‐Voltage Scanning Electron Microscopy: Characterizing Blends of ZnPc–C60 for Organic Solar Cells1 . Issue 6 (10th May 2016)

• Record Type: Journal Article
• Authors: Garitagoitia Cid, Aránzazu; Sedighi, Mona; Löffler, Markus; van Dorp, Willem F.; Zschech, Ehrenfried
• Is Part Of: Advanced engineering materials. Volume 18:Issue 6(2016:Jun.)
• Page Start: 913
• Page End: 917
• Publication Date: 2016-05-10
• Subjects: Materials -- Periodicals; 620.11
• DOI: 10.1002/adem.201600063
• Languages: English
• ISSNs: 1438-1656

Abstract

Abstract : Energy‐filtered backscattered electron imaging in a scanning electron microscope is performed on a blend of zinc‐phthalocyanine (ZnPc) and fullerene (C60 ), whose morphology is characterized using a novel energy selective backscattered (EsB) electron detector in combination with low acceleration voltages for the primary electrons. Such blends are used as an active layer of organic solar cells in bulk heterojunction architectures. The key to optimizing the solar cell performance is understanding the morphology of the blend components. Comparing the results to TEM micrographs, the EsB detector allows for a simple and fast identification of the phases in the blend. The relevance of the findings for applying ZnPc–C60 blends in solar cells is also discussed. Abstract : The morphology of a zinc‐phthalocyanine (ZnPc) and fullerene (C60 ) blend is imaged using the energy selective backscattered (EsB) electron detector in combination with low primary beam voltages. This blend can be used as an active layer for organic solar cells. Comparing the results to TEM micrographs, the EsB detector allows for a simple and fast identification of the blend phases. The relevance of the findings for applying ZnPc–C60 blends in solar cells is discussed.