Passivation of Molecular n‐Doping: Exploring the Limits of Air Stability. (3rd March 2016)
- Record Type:
- Journal Article
- Title:
- Passivation of Molecular n‐Doping: Exploring the Limits of Air Stability. (3rd March 2016)
- Main Title:
- Passivation of Molecular n‐Doping: Exploring the Limits of Air Stability
- Authors:
- Tietze, Max L.
Rose, Bradley D.
Schwarze, Martin
Fischer, Axel
Runge, Steffen
Blochwitz‐Nimoth, Jan
Lüssem, Björn
Leo, Karl
Brédas, Jean‐Luc - Abstract:
- Abstract : Molecular doping is a key technique for flexible and low‐cost organic complementary semiconductor technologies that requires both efficient and stable p‐ and n‐type doping. However, in contrast to molecular p‐dopants, highly efficient n‐type dopants are commonly sensitive to rapid degradation in air due to their low ionization energies ( IE s) required for electron donation, e.g., IE = 2.4 eV for tetrakis(1, 3, 4, 6, 7, 8‐hexahydro‐ 2H ‐pyrimido[1, 2‐ a ]pyrimidinato)ditungsten(II) (W2 (hpp)4 ). Here, the air stability of various host:W2 (hpp)4 combinations is compared by conductivity measurements and photoemission spectroscopy. A partial passivation of the n‐doping against degradation is found, with this effect identified to depend on the specific energy levels of the host material. Since host‐W2 (hpp)4 electronic wavefunction hybridization is unlikely due to confinement of the dopant highest occupied molecular orbital (HOMO) to its molecular center, this finding is explained via stabilization of the dopant by single‐electron transfer to a host material whose energy levels are sufficiently low for avoiding further charge transfer to oxygen–water complexes. Our results show the feasibility of temporarily handling n‐doped organic thin films in air, e.g., during structuring of organic field effect transistors (OFETs) by lithography. Abstract : The air sensitivity of various n‐doped organic thin films is investigated using the inherently air unstable W2 (hpp)4 . AirAbstract : Molecular doping is a key technique for flexible and low‐cost organic complementary semiconductor technologies that requires both efficient and stable p‐ and n‐type doping. However, in contrast to molecular p‐dopants, highly efficient n‐type dopants are commonly sensitive to rapid degradation in air due to their low ionization energies ( IE s) required for electron donation, e.g., IE = 2.4 eV for tetrakis(1, 3, 4, 6, 7, 8‐hexahydro‐ 2H ‐pyrimido[1, 2‐ a ]pyrimidinato)ditungsten(II) (W2 (hpp)4 ). Here, the air stability of various host:W2 (hpp)4 combinations is compared by conductivity measurements and photoemission spectroscopy. A partial passivation of the n‐doping against degradation is found, with this effect identified to depend on the specific energy levels of the host material. Since host‐W2 (hpp)4 electronic wavefunction hybridization is unlikely due to confinement of the dopant highest occupied molecular orbital (HOMO) to its molecular center, this finding is explained via stabilization of the dopant by single‐electron transfer to a host material whose energy levels are sufficiently low for avoiding further charge transfer to oxygen–water complexes. Our results show the feasibility of temporarily handling n‐doped organic thin films in air, e.g., during structuring of organic field effect transistors (OFETs) by lithography. Abstract : The air sensitivity of various n‐doped organic thin films is investigated using the inherently air unstable W2 (hpp)4 . Air stable n‐type conductive films are achieved as long as the electron affinity ( EA ) of the host material lies deep enough to prevent reduction of O2 (H2 O)n complexes, i.e., if EA > 3.6 eV. On the basisof DFT‐ωB97X‐D3 calculations, there is a further ability to exclude formation of electronic host‐dopant hybrid orbitals for these systems. … (more)
- Is Part Of:
- Advanced functional materials. Volume 26:Number 21(2016)
- Journal:
- Advanced functional materials
- Issue:
- Volume 26:Number 21(2016)
- Issue Display:
- Volume 26, Issue 21 (2016)
- Year:
- 2016
- Volume:
- 26
- Issue:
- 21
- Issue Sort Value:
- 2016-0026-0021-0000
- Page Start:
- 3730
- Page End:
- 3737
- Publication Date:
- 2016-03-03
- Subjects:
- degradation -- DFT -- molecular n‐doping -- organic semiconductors -- UPS
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1616-3028 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adfm.201505092 ↗
- Languages:
- English
- ISSNs:
- 1616-301X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.853900
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 2653.xml