Cite
HARVARD Citation
Habal, H. et al. (2016). A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits. Microelectronics and reliability. pp. 17-23. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Habal, H. et al. (2016). A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits. Microelectronics and reliability. pp. 17-23. [Online].