Dynamic crystal rotation resolved by high‐speed synchrotron X‐ray Laue diffraction. (1st April 2016)

• Record Type: Journal Article
• Authors: Huang, J. W.; E, J. C.; Huang, J. Y.; Sun, T.; Fezzaa, K.; Luo, S. N.
• Is Part Of: Journal of synchrotron radiation. Volume 23:Part 3(2016)
• Page Start: 712
• Page End: 717
• Publication Date: 2016-04-01
• Subjects: synchrotron X‐ray Laue diffraction -- crystal rotation; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S160057751600223X
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : High‐speed (submicrosecond) translation and rotation of crystals are tracked in real time via simultaneous synchrotron X‐ray imaging and Laue diffraction. Abstract : Dynamic compression experiments are performed on single‐crystal Si under split Hopkinson pressure bar loading, together with simultaneous high‐speed (250–350 ns resolution) synchrotron X‐ray Laue diffraction and phase‐contrast imaging. A methodology is presented which determines crystal rotation parameters, i.e. instantaneous rotation axes and angles, from two unindexed Laue diffraction spots. Two‐dimensional translation is obtained from dynamic imaging by a single camera. High‐speed motion of crystals, including translation and rotation, can be tracked in real time via simultaneous imaging and diffraction.