Na distribution in Cu(In, Ga)Se2 thin films: Investigation by atom probe tomography. (15th July 2015)

• Record Type: Journal Article
• Authors: Couzinie-Devy, F.; Cadel, E.; Barreau, N.; Arzel, L.; Pareige, P.
• Is Part Of: Scripta materialia. Volume 104(2015)
• Page Start: 83
• Page End: 86
• Publication Date: 2015-07-15
• Subjects: Solar cells -- Cu(In, Ga)Se2 -- Atom probe tomography -- Sodium; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2015.03.028
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract : Atom probe tomography (APT) has been used to study the distribution of Na atoms in polycrystalline Cu(In, Ga)Se2 (CIGSe) thin films. APT, which allows separate investigations of grain boundaries and grain interiors chemistry, shows the presence of inter- and intra-granular Na segregations. It is highlighted that these segregations are found associated to Cu-depletion and In-enrichment. The segregation of Na to crystalline point defects and extended ones is finally discussed regarding its impact on the electrical properties of CIGSe layers.