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HARVARD Citation
Wang, Y. et al. (n.d.). An intelligent control scheme for precise tip‐motion control in atomic force microscopy. Scanning. 38 (2), pp. 93-99. [Online].
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Wang, Y. et al. (n.d.). An intelligent control scheme for precise tip‐motion control in atomic force microscopy. Scanning. 38 (2), pp. 93-99. [Online].